Author/Authors :
Acciarri، نويسنده , , M and Arcesi، نويسنده , , B and Baschirotto، نويسنده , , A and Castello، نويسنده , , R and Furetta، نويسنده , , C and Pensotti، نويسنده , , S and Rancoita، نويسنده , , P.G. and Rattaggi، نويسنده , , M and Redaelli، نويسنده , , M and Seidman، نويسنده , , A، نويسنده ,
Abstract :
A test system, for an optical readout chain of a double-sided silicon microstrip detector, is presented. The system can be used for a quick but complete test of the working performance of the optical readout chain, and for finding exactly the faulty part of the readout chain, in case that an error is detected. It was designed, developed, and built for a silicon microvertex detector used at the LEP collider. A description, of both the hardwave and software of the system, is given. Finally, experimental results, of laboratory tests, are shown.
