Title of article
Spreading resistance measurements in p-n junctions — a simple technique
Author/Authors
Fabris، نويسنده , , L. and Goulding، نويسنده , , F.S. and Madden، نويسنده , , N.W. and Manfredi، نويسنده , , P.F.، نويسنده ,
Pages
4
From page
470
To page
473
Abstract
A simple technique to extract the location and value of parasitic series resistance in junction devices is discussed and an instrument which performs these measurements is described. Measurements of gate series resistance on several high figure of merit junction field-effect transistors are presented. The limitations in noise behavior due to this resistance are discussed.
Journal title
Astroparticle Physics
Record number
2000754
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