Compositional mapping of semiconductor quantum dots and rings

In this article we review the extensive experimental work on the compositional mapping of semiconductor quantum dots and rings. After a brief introduction of the various experimental techniques used for this purpose, the body of experimental results is presented, ordered by experimental technique (transmission electron microscopy, X-ray diffraction, photoelectron microscopy, scanning probe microscopy, and ion–atom probes) and material system (mainly III–Vs and Ge/Si). The article concludes with a discussion which critically compares these results and outlines some general trends.