Title of article
Correlation between a deep hole trap and the reverse annealing effect in neutron-irradiated silicon detectors
Author/Authors
Moll، نويسنده , , M and Feick، نويسنده , , H and Fretwurst، نويسنده , , E and Lindstrِm، نويسنده , , G، نويسنده ,
Pages
4
From page
194
To page
197
Abstract
We report on a correlation between a deep hole trap observed by TSC (Thermally Stimulated Current) and the so-called reverse annealing effect of the effective doping concentration in neutron-irradiated silicon detectors.
Journal title
Astroparticle Physics
Record number
2004951
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