Author/Authors :
Re، نويسنده , , V and DeWitt، نويسنده , , J and Dow، نويسنده , , S and Frey، نويسنده , , A and Johnson، نويسنده , , R.P and Kroeger، نويسنده , , W and Kipnis، نويسنده , , I and Leona، نويسنده , , A and Luo، نويسنده , , L and Mandelli، نويسنده , , E and Manfredi، نويسنده , , P.F. and Nyman، نويسنده , , M and Pedrali-Noy، نويسنده , , M and Poplevin، نويسنده , , P and Perazzo، نويسنده , , A and Roe، نويسنده , , N and Spencer، نويسنده , , N، نويسنده ,
Abstract :
This paper discusses the behaviour of a prototype rad-hard version of the chip developed for the readout of the BaBar silicon vertex tracker. A previous version of the chip, implemented in the 0.8 μm HP rad-soft version has been thoroughly tested in the recent times. It featured outstanding noise characteristics and showed that the specifications assumed as target for the tracker readout were met to a very good extent. The next step was the realization of a chip prototype in the rad-hard process that will be employed in the actual chip production. Such a prototype is structurally and functionally identical to its rad-soft predecessor. However, the process parameters being different, and not fully mastered at the time of design, some deviations in the behaviour were to be expected. The reasons for such deviations have been identified and some of them were removed by acting on the points that were left accessible on the chip. Other required small circuit modifications that will not affect the production schedule. The tests done so far on the rad-hard chip have shown that the noise behaviour is very close to that of the rad-soft version, that is fully adequate for the vertex detector readout.
Keywords :
ELECTRONICS , Readout , Noise , vertex