A coincidence counting system for a high count rate and very small true-to-accidental ratio

We have developed a special coincidence counting system which makes it possible to detect very rare coincident (or anticoincident) events under high accidental counting conditions. High differential uniformity which cannot be achieved by the ordinary TAC or TDC system was obtained. This system was designed to observe an intensity interference effect of an electron beam due to the quantum-mechanical nature of Fermi–Dirac statistics of electrons.