Title of article
Characterization of silicon microstrip detectors using an infrared laser system
Author/Authors
Abt، نويسنده , , I. and Masciocchi، نويسنده , , S. and Moshous، نويسنده , , B. and Perschke، نويسنده , , T. and Richter، نويسنده , , R.H. and Riechmann، نويسنده , , K. and Wagner، نويسنده , , W.، نويسنده ,
Pages
17
From page
303
To page
319
Abstract
An infrared laser system with variable wavelength is used to study fundamental properties of silicon microstrip detectors. Results of measurements concerning charge sharing among adjacent readout strips and depletion mapping are presented. The results are interpreted in a model framework which describes the charge sharing with the help of the so-called η-function. The wavelength dependence of the η-function is studied. Surface effects important for short wavelengths are observed.
Keywords
Silicon microstrip detector , Charge sharing , Infrared laser , Depletion mapping
Journal title
Astroparticle Physics
Record number
2008449
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