Title of article
A study of 8.5 μm microchannel plate X-ray optics
Author/Authors
Brunton، نويسنده , , A.N. and Martin، نويسنده , , A.P. and Fraser، نويسنده , , G.W. and Feller، نويسنده , , W.B.، نويسنده ,
Pages
10
From page
356
To page
365
Abstract
We have investigated the X-ray focusing properties of microchannel plates (MCPs) with square channels of side length 8.5 μm. Both planar and spherically slumped MCPs (radius of curvature Rslump=0.5m) have been examined. We have observed foci of 7′̂ and 14′̂ FWHM, respectively. In addition, we have measured the 8 keV X-ray reflectivity of channel surfaces which have been subjected to a variety of chemical treatments. These reflectivities are found to correspond closely to theoretical values calculated by a simple two-layer model of the MCP reflecting surfaces. The inferred values of surface roughness for those MCPs thermally annealed at 430°C is ∼11 Å, about a factor of two better than previously measured.
Keywords
Microchannel plates , X-ray optics , X-ray reflectivity , X-ray Astronomy , X-ray telescopes
Journal title
Astroparticle Physics
Record number
2009335
Link To Document