Author/Authors :
Sarma، نويسنده , , P.R and Pattanayak، نويسنده , , S.K. and Bandyopadhyay، نويسنده , , D.K and Bhandari، نويسنده , , R.K، نويسنده ,
Abstract :
Glaser magnets are used for focusing low-energy charged particle beams. But these magnets show appreciable aberrations which cause an increase in the beam emittance. We have designed and fabricated an improved Glaser magnet which reduces these aberrations. This has been achieved by tapering the pole pieces of the magnet.
Keywords :
Field measurement , Aberrations , Glaser magnets , Focusing of ions
