Title of article
Novel silicon n-on-p edgeless planar pixel sensors for the ATLAS upgrade
Author/Authors
Bomben، نويسنده , , M. and Bagolini، نويسنده , , A. and Boscardin، نويسنده , , M. and Bosisio، نويسنده , , L. and Calderini، نويسنده , , G. and Chauveau، نويسنده , , J. and Giacomini، نويسنده , , G. and La Rosa، نويسنده , , A. and Marchiori، نويسنده , , G. De Zorzi، نويسنده , , N.، نويسنده ,
Pages
5
From page
215
To page
219
Abstract
In view of the LHC upgrade phases towards HL-LHC, the ATLAS experiment plans to upgrade the inner detector with an all-silicon system. The n-on-p silicon technology is a promising candidate for the pixel upgrade thanks to its radiation hardness and cost effectiveness. The edgeless technology would allow for enlarging the area instrumented with pixel detectors. We report on the development of novel n-on-p edgeless planar pixel sensors fabricated at FBK (Trento, Italy), making use of the active edge concept for the reduction of the dead area at the periphery of the device. After discussing the sensor technology and fabrication process, we present device simulations (pre- and post-irradiation) performed for different sensor configurations. First preliminary results obtained with the test-structures of the production are shown.
Keywords
Fabrication technology , TCAD simulations , Planar silicon radiation detectors
Journal title
Astroparticle Physics
Record number
2010102
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