Title of article
Use of photoelectron microscopes as X-ray detectors for imaging and other applications
Author/Authors
Hwu، نويسنده , , Y. and Tsai، نويسنده , , W.L. and Lai، نويسنده , , B. and Mancini، نويسنده , , D.C. and Je، نويسنده , , J.H. and Noh، نويسنده , , D.Y. and Youn، نويسنده , , H.S. and Hwang، نويسنده , , C.S. and Cerrina، نويسنده , , F. and Swiech، نويسنده , , W. and Bertolo، نويسنده , , M. and Tromba، نويسنده , , G. and Margaritondo، نويسنده , , G.، نويسنده ,
Pages
5
From page
516
To page
520
Abstract
We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques.
Journal title
Astroparticle Physics
Record number
2010389
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