Author/Authors :
Shimazaki، نويسنده , , Shoichi and Taniguchi، نويسنده , , Takashi and Uchida، نويسنده , , Tomohisa and Ikeno، نويسنده , , Masahiro and Taniguchi، نويسنده , , Nanae and Tanaka، نويسنده , , Manobu M.، نويسنده ,
Abstract :
This paper describes the performance of the Belle II central drift chamber (CDC) front-end electronics. The front-end electronics consists of a current sensitive preamplifier, a 1/t cancellation circuit, baseline restorers, a comparator for timing measurement and an analog buffer for the dE/dx measurement on a CDC readout card. The CDC readout card is located on the endplate of the CDC. Mass production will be completed after the performance of the chip is verified. The electrical performance and results of a neutron/gamma-ray irradiation test are reported here.
Keywords :
Belle II experiment , Drift chamber , Front-end , BiCMOS process
