Author/Authors :
Pompili، نويسنده , , R. and Cianchi، نويسنده , , A. and Alesini، نويسنده , , D. and Anania، نويسنده , , M.P. and Bacci، نويسنده , , A. and Bellaveglia، نويسنده , , M. and Castellano، نويسنده , , M. and Chiadroni، نويسنده , , E. and Di Giovenale، نويسنده , , D. and Di Pirro، نويسنده , , G. and GATTI، نويسنده , , G. and Giorgianni، نويسنده , , F. and Ferrario، نويسنده , , M. and Lupi، نويسنده , , S. and Massimo، نويسنده , , F. and Mostacci، نويسنده , , A. and Rossi، نويسنده , , A.R. and Vaccarezza، نويسنده , , C. and Villa، نويسنده , , F.، نويسنده ,
Abstract :
At SPARC-LAB, we have installed an Electro-Optic Sampling (EOS) experiment for single shot, non-destructive measurements of the longitudinal distribution charge of individual electron bunches. The profile of the electron bunch field is electro-optically encoded into a Ti:Sa laser, having 130 fs (rms) pulse length, directly derived from the photocathodeʹs laser. The bunch profile information is spatially retrieved, i.e., the laser crosses with an angle of 30° with respect to the normal to the surface of EO crystal (ZnTe, GaP) and the bunch longitudinal profile is mapped into the laserʹs transverse profile. In particular, we used the EOS for a single-shot direct visualization of the time profile of a comb-like electron beam, consisting of two bunches, about 100 fs (rms) long, sub-picosecond spaced with a total charge of 160 pC. The electro-optic measurements (done with both ZnTe and GaP crystals) have been validated with both RF Deflector (RFD) and Michelson interferometer measurements.
Keywords :
PLASMA , Diagnostics , EOS , electro-optic
