Tests of the Monte Carlo simulation of the photon-tagger focal-plane electronics at the MAX IV Laboratory

Rate-dependent effects in the electronics used to instrument the tagger focal plane at the MAX IV Laboratory were recently investigated using the novel approach of Monte Carlo simulation to allow for normalization of high-rate experimental data acquired with single-hit time-to-digital converters (TDCs). The instrumentation of the tagger focal plane has now been expanded to include multi-hit TDCs. The agreement between results obtained from data taken using single-hit and multi-hit TDCs demonstrate a thorough understanding of the behavior of the detector system.