Title of article
Sub-picosecond bunch length measurement at the TESLA test facility
Author/Authors
P and Geitz، نويسنده , , M and Schmidt، نويسنده , , P. Schmüser، نويسنده , , P and Walter، نويسنده , , G.v، نويسنده ,
Pages
5
From page
343
To page
347
Abstract
Sub-picosecond electron bunches are required for the operation of future VUV and X-ray Free Electron Lasers. A streak camera, a Martin–Puplett interferometer and a longitudinal phase space rotation method have been applied at the TESLA Test Facility linac to measure electron bunch lengths.
Journal title
Astroparticle Physics
Record number
2012052
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