Degradation of saturation output of the COTS array charge-coupled devices induced by total dose radiation damage

Experiments of total dose radiation effects on COTS array charge-coupled device (CCD) and annealing measurements are shown. Degradations of saturation output voltage at different bias conditions are analyzed, and their mechanisms induced by radiation are also demonstrated. Degradations of saturation output imaging at different total doses and the recovery after annealing are also compared. The phenomena of imaging degradation induced by total dose irradiation are analyzed. The camera imaging quality of resolution test card degraded by total dose irradiation is also analyzed. Finally, integration research from the irradiation-sensitive parameter degradation to the camera imaging degradation of the array CCD is achieved.