Title of article
Sc–Si normal incidence mirrors for a VUV interval of 35–50 nm
Author/Authors
Uspenskii، نويسنده , , Yu.A and Levashov، نويسنده , , V.E. and Vinogradov، نويسنده , , A.V and Fedorenko، نويسنده , , A.I and Kondratenko، نويسنده , , V.V and P.Pershin، نويسنده , , Yu and Zubarev، نويسنده , , E.N and Mrowka، نويسنده , , S and Schنfers، نويسنده , , F، نويسنده ,
Pages
5
From page
147
To page
151
Abstract
The Sc/Si multilayers are suggested as high-reflectivity coatings for a VUV interval of 35–50 nm. Fabricated mirrors show the normal incidence reflectivity of 30–50% which is high enough to effectively manipulate the beams of synchrotron radiation and compact discharge and laser-driven X-ray lasers. The obtained values are not, however, limiting for the Sc/Si coatings. Theoretical estimations as well as electron microscopy studies of Sc–Si interfaces indicate a large potential for further raising the reflectivity.
Keywords
Vacuum ultraviolet , MIRROR , Multilayers
Journal title
Astroparticle Physics
Record number
2012373
Link To Document