Author/Authors :
Fernلndez-Perea، نويسنده , , Mَnica and Pivovaroff، نويسنده , , Mike J. and Soufli، نويسنده , , Regina and Alameda، نويسنده , , Jennifer and Mirkarimi، نويسنده , , Paul and Descalle، نويسنده , , Marie-Anne and Baker، نويسنده , , Sherry L. and McCarville، نويسنده , , Tom and Ziock، نويسنده , , Klaus and Hornback، نويسنده , , Donald and Romaine، نويسنده , , Suzanne and Bruni، نويسنده , , Ric and Zhong، نويسنده , , Zhong and Honkimنki، نويسنده , , Veijo and Ziegler، نويسنده , , Eric and Christensen، نويسنده , , Finn E. and Jakobsen، نويسنده , , Anders C.، نويسنده ,
Abstract :
Multilayer coatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayer coatings to photon energies higher than previously achieved, we have developed multilayers with ultra-short periods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.
Keywords :
Thin films , tungsten carbide , Hard x-ray mirrors , Gamma-ray mirrors , Multilayer coatings , silicon carbide
