Title of article :
Development of edgeless n-on-p planar pixel sensors for future ATLAS upgrades
Author/Authors :
Bomben، نويسنده , , Marco and Bagolini، نويسنده , , Alvise and Boscardin، نويسنده , , Maurizio and Bosisio، نويسنده , , Luciano and Calderini، نويسنده , , Giovanni and Chauveau، نويسنده , , Jacques and Giacomini، نويسنده , , Gabriele and La Rosa، نويسنده , , Alessandro and Marchiori، نويسنده , , Giovanni and Zorzi، نويسنده , , Nicola، نويسنده ,
Pages :
7
From page :
41
To page :
47
Abstract :
The development of n-on-p “edgeless” planar pixel sensors being fabricated at FBK (Trento, Italy), aimed at the upgrade of the ATLAS Inner Detector for the High Luminosity phase of the Large Hadron Collider (HL-LHC), is reported. A characterizing feature of the devices is the reduced dead area at the edge, achieved by adopting the “active edge” technology, based on a deep etched trench, suitably doped to make an ohmic contact to the substrate. The project is presented, along with the active edge process, the sensor design for this first n-on-p production and a selection of simulation results, including the expected charge collection efficiency after radiation fluence of 1 × 10 15 n eq / cm 2 comparable to those expected at HL-LHC (about ten years of running, with an integrated luminosity of 3000 fb−1) for the outer pixel layers. We show that, after irradiation and at a bias voltage of 500 V, more than 50% of the signal should be collected in the edge region; this confirms the validity of the active edge approach.
Keywords :
Fabrication technology , Planar silicon radiation detectors , TCAD simulations
Journal title :
Astroparticle Physics
Record number :
2013027
Link To Document :
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