Test of silicon strip detectors for the ZEUS microvertex detector

For the HERA luminosity upgrade in the year 2000, the ZEUS experiment is preparing a high precision vertex detector using single-sided silicon microstrip detectors with capacitive charge division. Main characteristics of each strip detector such as full depletion voltage, the diode leakage current and the number of damaged read-out strips are measured for each detector. A test of the long-term stability has been performed. Each detector was biased at 200 V for at least 24 h, while its leakage current has been monitored. This article describes the quality control program for the ZEUS silicon strip detectors and present results of the test measurements.