Requirements for X-ray structure analysis with modern synchrotron light sources

X-ray diffraction methods, including macromolecular crystallography, small-angle scattering from partly or noncrystalline systems, fiber and surface diffraction, are in the forefront of interest of a broad synchrotron user community from biomedical and technological fields. The main impact comes from the unsurpassed X-ray flux and brilliance of modern third-generation sources, facilitating on the one hand, a dramatic enhancement in sample throughput, and on the other hand, the transformation of X-ray diffraction analysis from a static to a cinematographic technique. In the present article some of the requirements for further development are being discussed.