Title of article
Functional characterization of planar sensors with active edges using laser and X-ray beam scans
Author/Authors
Povoli، نويسنده , , M. and Bagolini، نويسنده , , A. and Boscardin، نويسنده , , M. and Dalla Betta، نويسنده , , G.-F. and Giacomini، نويسنده , , G. and Hasi، نويسنده , , J. and Oh، نويسنده , , A. and Zorzi، نويسنده , , N.، نويسنده ,
Pages
3
From page
350
To page
352
Abstract
We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.
Keywords
Numerical simulations , TCAD , functional characterization , Test structures , Laser , Active edge , Silicon detectors , X-Ray
Journal title
Astroparticle Physics
Record number
2013396
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