• Title of article

    Functional characterization of planar sensors with active edges using laser and X-ray beam scans

  • Author/Authors

    Povoli، نويسنده , , M. and Bagolini، نويسنده , , A. and Boscardin، نويسنده , , M. and Dalla Betta، نويسنده , , G.-F. and Giacomini، نويسنده , , G. and Hasi، نويسنده , , J. and Oh، نويسنده , , A. and Zorzi، نويسنده , , N.، نويسنده ,

  • Pages
    3
  • From page
    350
  • To page
    352
  • Abstract
    We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.
  • Keywords
    Numerical simulations , TCAD , functional characterization , Test structures , Laser , Active edge , Silicon detectors , X-Ray
  • Journal title
    Astroparticle Physics
  • Record number

    2013396