Title of article
X-ray tomography for the ATLAS semi-conductor tracker
Author/Authors
Doucas، نويسنده , , G and Grosse-Knetter، نويسنده , , J and Nickerson، نويسنده , , R and Vertogradov، نويسنده , , L، نويسنده ,
Pages
9
From page
43
To page
51
Abstract
Results are presented of precision tests with the prototype of an X-ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 μm in rφ and better than 30 μm in r, where r and φ are polar coordinates, and are sufficient for a high-precision survey of the barrels of the ATLAS semi-conductor tracker.
Keywords
Silicon detector , LHC , X-ray tomography , Precision metrology
Journal title
Astroparticle Physics
Record number
2013736
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