Material uniformity of CdZnTe grown by low-pressure bridgman

We have employed Low-Temperature Photoluminescence (LTPL) and Room-Temperature Photoluminescence Mapping (RTPLM) to explore the crystalline quality and material uniformity of Cadmium Zinc Telluride (CZT) radiation detector material grown by the Low-Pressure Bridgman (LPB) technique. We report on the differences in crystalline quality and uniformity of material supplied by eV Products Inc. and IMARAD Imaging Systems Ltd. In addition, we have examined the general detector response of the material supplied by IMARAD. We report on the uniformity of the detector response and the temperature dependence of this response when used as a detector.