Author/Authors :
Komar، نويسنده , , V. and Gektin، نويسنده , , A. and Nalivaiko، نويسنده , , D. and Klimenko، نويسنده , , I. and Migal، نويسنده , , V. and Panchuk، نويسنده , , O. and Rybka، نويسنده , , A.، نويسنده ,
Abstract :
Three individual groups of HPB CZT crystals were grown under different thermal conditions. The study of structure defects and non-uniformities in the crystals was performed and the results were connected with configuration of the liquid–solid interface shape at crystallization. Various conventional methods and some new techniques (adiabatic laser calorimetry, photorelaxation and thermorelaxation dielectric spectroscopy) were used to display an improvement of CZT crystallinity and homogeneity of Zn distribution, as interface shape becomes more uniform. It was shown that spectrometric-grade CZT crystals can be obtained by HPB growth process just under specific thermal conditions.
Keywords :
High-pressure Bridgman method , Crystalline defects , cadmium zinc telluride , Investigation methods , Thermal growth conditions , Crystal growth , Detection properties
