Title of article
Optical response of the graded-gap AlxGa1−xAs X-ray detector
Author/Authors
Pozela، نويسنده , , K. and Pozela، نويسنده , , J. and Dapkus، نويسنده , , L. and Jasutis، نويسنده , , V. and Silenas، نويسنده , , A. and Smith، نويسنده , , K.M. and Bendorius، نويسنده , , R.A.، نويسنده ,
Pages
5
From page
58
To page
62
Abstract
It has been observed that only a part of the AlxGa1−xAs graded-gap layer with the energy gap gradient g>20 eV/cm is active as a X-ray luminescence source. The thickness of the active layer is 30–50 μm. To increase the detectors optical response efficiency, the following methods are proposed and tested:
tion of the X-ray luminescence light, generated in the bulk AlxGa1−xAs layer, inside the total reflection angle θ;
l stimulation of the electron–hole radiative recombination.
Keywords
Radiation imaging , Light-emitting detectors
Journal title
Astroparticle Physics
Record number
2016061
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