Time- and wavelength-resolved luminescence evaluation of several types of scintillators using streak camera system equipped with pulsed X-ray source

To design new scintillating materials, it is very important to understand detailed information about the events, which occurred during the excitation and emission processes under the ionizing radiation excitation. We developed a streak camera system equipped with picosecond pulsed X-ray source to observe time- and wavelength-resolved scintillation events. In this report, we test the performance of this new system using several types of scintillators including bulk oxide/halide crystals, transparent ceramics, plastics and powders. For all samples, the results were consistent with those reported previously. The results demonstrated that the developed system is suitable for evaluation of the scintillation properties.