Author/Authors :
Keil، نويسنده , , P. and Lützenkirchen-Hecht، نويسنده , , D. and Novikov، نويسنده , , D.V. and Hahn، نويسنده , , U. and Frahm، نويسنده , , R.، نويسنده ,
Abstract :
The optical performance and roughness parameters of an X-ray mirror that was used for several years in a synchrotron radiation beamline are determined by studying its X-ray reflectivity and diffuse scattering behavior. These values are compared to the data derived from topographic measurements with an atomic force microscope (AFM).
Keywords :
X-Ray mirror , diffuse scattering , X-ray reflectivity , X-Ray scattering , GIXS
