Author/Authors :
H. Hiraka، نويسنده , , H. and Fujiwara، نويسنده , , K. and Yamada، نويسنده , , K. and Morishita، نويسنده , , K. and Nakajima، نويسنده , , K.، نويسنده ,
Abstract :
Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity ( I θ ). Stacking such wafers is efficient in amplifying I θ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.
Keywords :
Mosaic crystal , Plastically deformed Si wafer , Neutron monochromator , neutron reflectivity
