Author/Authors :
Snigireva، نويسنده , , I. V. Kohn and E. A. Manykin ، نويسنده , , V. and Snigirev، نويسنده , , A.، نويسنده ,
Abstract :
A simple interferometric technique for hard X-ray spatial coherence characterization, recording a Fresnel interference pattern produced by a round fiber or by a slit was proposed. Analytical formulas that give a direct relation between the visibility of interference fringes and either the source size or the transverse coherence length were derived. The technique was experimentally applied to determine spatial coherence length and source size at the European Synchrotron Radiation Facility.