Author/Authors :
Roper، نويسنده , , M.D. and van der Laan، نويسنده , , G. and Dürr، نويسنده , , H.A. and Dudzik، نويسنده , , E. and Collins، نويسنده , , S.P. and Miller، نويسنده , , M.C. and Thompson، نويسنده , , S.P.، نويسنده ,
Abstract :
There has been a recent rapid increase in interest in the measurement of soft X-ray magnetic scattering (SoXMaS) to characterize the distribution of magnetic moments in thin films and multilayers. The Daresbury Laboratory team has adapted a high-vacuum two-circle diffractometer for pioneering measurements in this field. The principal features of the diffractometer and the alignment procedure for SoXMaS measurements are presented. A flexible data acquisition system is used, which allows a wide variety of scan modes and control of the various beamlines on which the experiments have been performed.
