Title of article :
A Compton polarimeter for Parametric X-radiation
Author/Authors :
They، نويسنده , , J. and Buschhorn، نويسنده , , G. and Kotthaus، نويسنده , , R. and Pugachev، نويسنده , , D.، نويسنده ,
Abstract :
A compact 90°–Compton scatter polarimeter has been developed to be used for energy resolved linear polarization analysis of Parametric X-radiation (PXR) in the energy range below 10 keV. The polarimeter employs thermoelectrically cooled silicon drift detectors. The polarization sensitivity and instrumental asymmetries of the polarimeter have been studied with synchrotron radiation at energies from 6 to 11 keV. The analyzing power is close to unity in agreement with expectations and Monte Carlo simulation results. Instrumental asymmetries of a few percent have been measured and corrected with residual statistical uncertainties of O (10−3). The orientation of the polarization plane is determined to be within 4 m.
Keywords :
Compton polarimeter , X-ray polarimetry , Silicon drift detector , Semiconductor drift chamber , Parametric X-radiation
Journal title :
Astroparticle Physics