Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation

I report on the wavelength resolution options that can be made available on a time-of-flight reflectometer. I take the example of the newly commissioned reflectometer BioRef at Helmholtz-Zentrum Berlin for the purpose. Calculations and simulations using the software package VITESS, I show potential increase in flux densities, an extension of the momentum transfer range accessible as well as a significant extension of the range of constant wavelength resolution of the instrument. It is therefore possible to achieve a virtually continuous range of wavelength resolution from 5% to 11% by using a combination of four different chopper systems. This can be a unique advantage on the time-of-flight reflectometer in investigating thin-film structures accessing a wide range of thicknesses.