Author/Authors :
Yoshikawa، نويسنده , , M. and Okamoto، نويسنده , , Y. and Kawamori، نويسنده , , E. and Watanabe، نويسنده , , Y. and Watabe، نويسنده , , C. and Yamaguchi، نويسنده , , N. and Tamano، نويسنده , , T.، نويسنده ,
Abstract :
A grazing incidence flat-field soft X-ray (20–350 Å) spectrograph was constructed and applied for impurity diagnostics in the GAMMA 10 fusion plasma. The spectrograph consisted of a limited height entrance slit, an aberration-corrected concave grating, a microchannel-plate intensified detector and an instant camera/a high speed solid state camera. An absolute calibration experiment for the SX spectrograph was performed at the Photon Factory in the High Energy Accelerator Research Organization with monitoring the incident synchrotron beam intensity by using an absolutely calibrated XUV silicon photodiode. From the results of absolute calibration of the spectrograph, the radiation loss from the plasma was obtained.