Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements

A new type of Compton spectrometer is introduced for use at energies of 100 keV. Synchrotron radiation beam of a well-defined energy gradient is reflected on the sample by a cylindrically bent Laue-type monochromator, and the scattered radiation is analyzed by another bent Laue-type crystal. It is shown that nearly exact dispersion compensation is achieved over the entire energy spectrum. Due to the increased reflecting power of asymmetrically cut bent crystals the average count rate of Compton scattering is of the order of 104 cps, while the momentum resolution of the spectrometer is 0.1 a.u. or better. Results of the first test measurements are presented.