Title of article :
Combined in situ X-ray absorption and diffuse reflectance infrared spectroscopy: An attractive tool for catalytic investigations
Author/Authors :
Marinkovic، نويسنده , , N.S. and Wang، نويسنده , , Q. and Barrio، نويسنده , , L. and Ehrlich، نويسنده , , S.N. and Khalid، نويسنده , , S. and Cooper، نويسنده , , C. and Frenkel، نويسنده , , A.I.، نويسنده ,
Abstract :
Catalysis investigations are often followed in a range of spectroscopic techniques. While diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) can be done on a bench-top instrument, X-ray absorption spectroscopy (XAS) techniques, such as extended X-ray absorption fine structure (EXAFS) and X-ray absorption near-edge structure (XANES) require synchrotron light. In order to ensure the same conditions during in situ catalysis for each method, a combined XAS/DRIFTS has been developed at beamline X18A at the National Synchrotron Light Source, Brookhaven National Laboratory. A rapid-scan FTIR spectrometer capable of both mid- and far-infrared measurements is equipped with an arm to redirect the IR beam outside the spectrometer. An in situ reaction chamber, equipped with glassy carbon windows for X-ray light and a KBr window for IR light passage is installed firmly on the arm. The reaction cell can be heated to 600 °C and allows passage of gases through the catalyst so that both XAS and DRIFTS techniques can be done simultaneously in controlled environment conditions. Together with a fast-moving monochromator for quick-EXAFS and mass-spectrometric residual gas analysis, this new tool is a powerful method for testing catalytic reactions in real time.
Keywords :
Combined XAS/DRIFTS , X-ray absorption spectroscopy , Diffuse reflectance infrared , Fourier transform spectroscopy , Quick-EXAFS
Journal title :
Astroparticle Physics