Author/Authors :
Ehrlich، نويسنده , , S.N. and Hanson، نويسنده , , J.C. and Lopez Camara، نويسنده , , Peter Marwedel
Carlos A. Lopez-Barrio
، نويسنده , , L. and Estrella، نويسنده , , M. and Zhou، نويسنده , , G. and Si، نويسنده , , R. and Khalid، نويسنده , , S. and Wang، نويسنده , , Q.، نويسنده ,
Abstract :
X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) are complementary techniques for investigating the structure of materials. XRD probes long range order and XAFS probes short range order. We have combined the two techniques at one synchrotron beamline, X18A at the NSLS, allowing samples to be studied in a single experiment. This beamline will allow for coordinated measurements of local and long range structural changes in chemical transformations and phase transitions using both techniques.
Keywords :
XRD , XAFS , Combined XRD/XAFS , Quick XAFS , Time-resolved XRD
