Title of article
Combined XRD and XAS
Author/Authors
Ehrlich، نويسنده , , S.N. and Hanson، نويسنده , , J.C. and Lopez Camara، نويسنده , , Peter Marwedel Carlos A. Lopez-Barrio ، نويسنده , , L. and Estrella، نويسنده , , M. and Zhou، نويسنده , , G. and Si، نويسنده , , R. and Khalid، نويسنده , , S. and Wang، نويسنده , , Q.، نويسنده ,
Pages
3
From page
213
To page
215
Abstract
X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) are complementary techniques for investigating the structure of materials. XRD probes long range order and XAFS probes short range order. We have combined the two techniques at one synchrotron beamline, X18A at the NSLS, allowing samples to be studied in a single experiment. This beamline will allow for coordinated measurements of local and long range structural changes in chemical transformations and phase transitions using both techniques.
Keywords
XRD , XAFS , Combined XRD/XAFS , Quick XAFS , Time-resolved XRD
Journal title
Astroparticle Physics
Record number
2017148
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