Powder diffractometry on polychromatic synchrotron radiation (approach to a problem)

The method of the determination of interplanar spaces and relative intensities for polycrystalline samples from the X-ray patterns that have been taken in polychromatic radiation is offered. The method is based on the construction of a model X-ray pattern and minimization of the difference between it and the experimental curve. It is shown by model experiments for SrO2, Cu and Al that the method is proof against experimental errors and that errors of definition of parameters are of the same order as those for X-rays pattern obtained in monochromatic radiation. The influence of absorption edges of elements being a part of the sample on the X-ray pattern and the possibility of using them for improvement of experiment quality are discussed.