Author/Authors :
Sundaram، نويسنده , , S.K. and Henager Jr.، نويسنده , , C.H. and Edwards، نويسنده , , D.J. and Schemer-Kohrn، نويسنده , , A.L. and Bliss، نويسنده , , M. and Riley، نويسنده , , B.R. and Toloczko، نويسنده , , M.B. and Lynn، نويسنده , , K.G.، نويسنده ,
Abstract :
Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features and orientation relations in as-grown CZT crystals to aid in understanding the relation between structure and properties in radiation detectors. Even carefully prepared single crystals of CZT contain regions of slight misorientation, Te-particles, and dislocation networks that must be understood for more accurate models of detector response. This paper describes initial research at PNNL into the hierarchy of microstructures observed in CZT grown via the vertical gradient freeze or vertical Bridgman method at PNNL and WSU.
Keywords :
CdZnTe , Crystal growth , Microstructures , Electron backscatter diffraction , hierarchical , Infrared microscopy , Tellurium precipitate , Twin boundaries
