First results of the high resolution wire scanners for beam profile and absolute beam position measurement at the TTF

In the TESLA Test Facility, wire scanners are used to measure the electron beam profile and position. The intended use of the wire scanners (to center the electron beam in the Free Electron Laser undulator) requires an especially precise alignment of the wire scanners with respect to the undulator axis. The wire scanners should define a reference axis with respect to the external reference system of the undulator with an accuracy better than 30 μm. The wire scanners allow a beam profile measurement, which will be used to optimize and match the beam optics for the undulator. First experimental results of beam position and profile will be presented and discussed.