Diffraction peaks restoration and extraction in energy dispersive X-ray diffraction

This paper proposes a method to restore energy dispersive X-ray diffraction (EDXRD) spectra and to extract diffraction peaks. It follows a maximum a posteriori approach using a physical model of the formation of the EDXRD data to remove blur caused by both the detector and the coarse angular resolution of X-ray tube based EDXRD setup. It separates peaks due to the diffraction by crystalline material from a continuous background. Tested on real data (graphite and NaCl), our algorithm achieved to detect diffraction peaks with a good precision (about 1 keV depending on the peak position) even at high energy where very few photons were measured.