Author/Authors :
Badalà، نويسنده , , A. La Barbera، نويسنده , , R. and Lo Re، نويسنده , , G. and Palmeri، نويسنده , , A. and Pappalardo، نويسنده , , G.S. and Riggi، نويسنده , , F. and Di Liberto، نويسنده , , S. and Meddi، نويسنده , , F. and Cavagnoli، نويسنده , , A. and Morando، نويسنده , , M. and Scarlassara، نويسنده , , F. and Segato، نويسنده , , G. and Soramel، نويسنده , , F. and Vannucci، نويسنده , , L.، نويسنده ,
Abstract :
The problem of radiation damage for the electronics of the pixel detectors in the Inner-Tracking-System of the ALICE experiment is discussed. Simulations allowed to estimate total doses and particle fluences during 10 years of operation period. Several irradiation tests have been carried out on the various prototypes of the readout chips. The results obtained so far points out that the recent prototypes will retain their functionality up to doses and neutron fluences well above those expected in ALICE.
Keywords :
Silicon , Radiation damage , microelectronics , pixel , detector
