Author/Authors :
Boscardin، نويسنده , , M and Bosisio، نويسنده , , L. and Carmel-Barnea، نويسنده , , N and Dalla Betta، نويسنده , , G.-F and Ferrario، نويسنده , , L and Rachevskaia، نويسنده , , I and Zen، نويسنده , , M، نويسنده ,
Abstract :
We report on a computer tool, based on Perl programming language, providing automatic analysis of experimental data from microstrip detector parametric measurements. Besides handling graphical display of data and statistical calculations, the program is intended to check for possible process-related problems by correlating the various measurements. The proposed software has proved itself to be a useful tool for the development of double-sided AC-coupled microstrip detectors at IRST, successfully identifying several process-related defects, as confirmed by optical inspection of the wafers.
