Author/Authors :
Blنckberg، نويسنده , , Richard L. and Fay، نويسنده , , A. and Jُgi، نويسنده , , I. and Biegalski، نويسنده , , S. and Boman، نويسنده , , M. and Elmgren، نويسنده , , K. and Fritioff، نويسنده , , T. and Johansson، نويسنده , , A. and Mهrtensson، نويسنده , , L. and Nielsen، نويسنده , , F. and Ringbom، نويسنده , , A. and Rooth، نويسنده , , M. and Sjِstrand، نويسنده , , H. and Klintenberg، نويسنده , , M.، نويسنده ,
Abstract :
In this work Al2O3 and SiO2 coatings are tested as Xe diffusion barriers on plastic scintillator substrates. The motivation is improved beta–gamma coincidence detection systems, used to measure atmospheric radioxenon within the verification regime of the Comprehensive Nuclear-Test-Ban Treaty. One major drawback with the current setup of these systems is that the radioxenon tends to diffuse into the plastic scintillator material responsible for the beta detection, resulting in an unwanted memory effect. Here, coatings with thicknesses between 20 and 900 nm have been deposited onto plastic scintillators, and investigated using two different experimental techniques. The results show that all tested coatings reduce the Xe diffusion into the plastic. The reduction is observed to increase with coating thickness for both coating materials. The 425 nm Al2O3 coating is the most successful one, presenting a diffusion reduction of a factor 100, compared to uncoated plastic. In terms of memory effect reduction this coating is thus a viable solution to the problem in question.
Keywords :
Comprehensive Nuclear-Test-Ban Treaty , Gas diffusion barrier , Plasma enhanced chemical vapor deposition , atomic layer deposition , Plastic scintillator , Radioxenon