Comprehensive measurements of GaAs pixel detectors capacitance

We have studied GaAs pixel detectors on semi-insulating wafers with Schottky contacts. We performed comprehensive measurements on the inter-pixel and capacitance to back plane. Being semi-insulating, the behaviour is totally different with respect to other common semiconductors, such as high resistivity silicon. Non-homogeneities are also an issue, due to both the contacts and the crystal bulk. In order to detect them and their influence on capacitance, we undertook systematic measurements with different configurations of the measuring electrodes.