Ionizing radiation effects in XC4036X field programmable gate arrays

We have measured the effects of total ionizing dose on Xilinx XC4036X field programmable gate arrays. The field programmable gate arrays were irradiated with photons at a dose rate of about 1 mGy/s. An average total dose of 384 Gy(Si) and 155 Gy(Si) were absorbed by the XL-series and XLA-series field programmable gate arrays, respectively, before the power supply current increased.