Author/Authors :
Antich، نويسنده , , P and Malakhov، نويسنده , , N and Parkey، نويسنده , , R and Slavin، نويسنده , , N and Tsyganov، نويسنده , , E، نويسنده ,
Abstract :
A novel technique has been developed and tested for the three-dimensional measurement of position in SPECT-PET detectors. Results are presented for 2 and 20 mm thick NaI(Tl) planar crystals. In a plane of crystal, a coordinate resolution of about 1 mm (rms error) is demonstrated. The depth of interaction (DOI) is measured with an rms error of about 2 mm using light cone parameters.
