Title of article
Geant4 simulation of a filtered X-ray source for radiation damage studies
Author/Authors
Guthoff، نويسنده , , M. and Brovchenko، نويسنده , , O. and de Boer، نويسنده , , W. and Dierlamm، نويسنده , , A. and Müller، نويسنده , , T. and Ritter، نويسنده , , A. and Schmanau، نويسنده , , M. and Simonis، نويسنده , , H.-J.، نويسنده ,
Pages
5
From page
118
To page
122
Abstract
Geant4 low energy extensions have been used to simulate the X-ray spectra of industrial X-ray tubes with filters for removing the uncertain low energy part of the spectrum in a controlled way. The results are compared with precisely measured X-ray spectra using a silicon drift detector. Furthermore, this paper shows how the different dose rates in silicon and silicon dioxide layers of an electronic device can be deduced from the simulations.
Keywords
X-Ray , Energy spectrum , Silicon drift diode , GEANT4
Journal title
Astroparticle Physics
Record number
2019279
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