Detailed models for timing and efficiency in resistive plate chambers

We discuss detailed models for detector physics processes in Resistive Plate Chambers, in particular including the effect of attachment on the avalanche statistics. In addition, we present analytic formulas for average charges and intrinsic RPC time resolution. Using a Monte Carlo simulation including all the steps from primary ionization to the front-end electronics we discuss the dependence of efficiency and time resolution on parameters like primary ionization, avalanche statistics and threshold.