مرکز منطقه ای اطلاع رساني علوم و فناوري

Title of article :

Applying X-rays in material analysis

Author/Authors :

Kogan، نويسنده , , Vladimir and Bethke، نويسنده , , Klaus and Vries، نويسنده , , Roelof de، نويسنده ,

Pages :

From page :

290

To page :

293

Abstract :

This paper presents some applications of X-ray diffraction analysis for the development and quality control of modern semiconductor detectors.

Keywords :

X-ray diffraction , Thin films , quality control , Semiconductor materials

Journal title :

Astroparticle Physics

Record number :

2021058

Link To Document :